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  1. IEEE International Workshop on Memory Technology, Design and Testing.
  2. 2009 IEEE International Workshop on Memory Technology, Design, and Testing
  3. Title Page iii
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2009 IEEE International Workshop on Memory Technology, Design, and Testing
Cover Art
Title Page i
Title Page iii
Copyright Page
Table of Contents
Foreword
Program Committee
Reviewers
Keynote Speech 1
Keynote Speech 2
Invited Talk 1
Invited Talk 2
Invited Talk 3
Tutorial
Voltage-Driven Multilevel Programming in Phase Change Memories
Circuit Design for Bias Compatibility Investigation of Bulk FinFET Based Floating Body RAM
A New SRAM Cell Design for Both Power and Performance Efficiency
A Wide-VDD Embedded SRAM for Dynamic Voltage Asynchronous Systems
Impacts of Contact Resistance and NBTI/PBTI on SRAM with High-? Metal-Gate Devices
High-k Hf-Based Nanocrystal Memory Capacitors with IrOx Metal Gate for NAND Application
A Micro-Watt Multi-port Register File with Wide Operating Voltage Range
Three-Transistor DRAM-Based Content Addressable Memory Design for Reliability and Area Efficiency
Variability-Tolerant Binary Content Addressable Memory Cells
Memory Repair by Die Stacking with through Silicon Vias
3-D Content Addressable Memory Architectures
Cost-Aware Lifetime Yield Analysis of Heterogeneous 3D On-chip Cache
Rapid and Accurate Timing Modeling for SRAM Compiler
Modeling of SRAM Standby Current by Three-Parameter Lognormal Distribution
On Distinguishing Process Corners for Yield Enhancement in Memory Compiler Generated SRAM
Efficient DRAM Characterization Using Improved Searches, Branching and Automated Pattern Generation
Author index
Publisher's Information
2007 IEEE International Workshop on Memory Technology, Design and Testing
2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06)
2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05)
Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004.
Records of the 2003 International Workshop on Memory Technology, Design and Testing
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)
Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing
Records of the IEEE International Workshop on Memory Technology, Design and Testing
Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing
Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236)
Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159)
IEEE International Workshop on Memory Technology, Design and Testing,
Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing
Proceedings of IEEE International Workshop on Memory Technology, Design, and Test
Records of the 1993 IEEE International Workshop on Memory Testing

Title Page iii

Content Provider IEEE Xplore Digital Library
Copyright Year 2009
File Size 59938
File Format PDF
ISBN 9780769537979
DOI 10.1109/MTDT.2009.2
Language English
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date 2009-08-31
Publisher Place Taiwan
Access Restriction Subscribed
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Content Type Text
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