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  1. Antennas and Propagation Magazine
  2. Year : 1990 Volume : 32
  3. Issue 5
  4. The impedance matrix localization (IML) method for moment-method calculations
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Year : 1990 Volume : 32
Issue 6
Issue 5
AVNA-based polarimetric scatterometers
The impedance matrix localization (IML) method for moment-method calculations
A comparison of cloud models (EM wavescattering)
PCs for AP (EM computation)
Issue 4
Issue 3
Issue 2
Issue 1

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The impedance matrix localization (IML) method for moment-method calculations

Content Provider IEEE Xplore Digital Library
Author Canning, F.X.
Copyright Year 1990
Abstract The impedance matrix localization (IML) method, a modification of the standard method of moments that can be implemented as a modification to existing computer programs, is examined. This modification greatly eases the excessive storage requirements and long computation times of moment-method approaches by using novel bases and testing function that localize the important interactions to only a small number of elements within the impedance matrix elements can be made so small (typically 10/sup -4/ to 10/sup -6/ in relative magnitude) that they may be approximated by zero. In the case of a two-dimensional body with unknowns on its surface, both analytical arguments and numerical calculations suggest that, for an N*N matrix, about 100N matrix elements will need to be kept, even for very large N. The resulting sparse matrix requires storage for only 100N complex numbers rather than for N/sup 2/ numbers. Similar results are expected in three dimensions. The structure of the resulting matrix problem allows the use of highly efficient solution methods. Results are given for one such possibility: iteration preconditioned by incomplete LU decomposition.<>
Starting Page 18
Ending Page 30
Page Count 13
File Size 1357945
File Format PDF
ISSN 10459243
Volume Number 32
Issue Number 5
Language English
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date 1990-10-01
Publisher Place U.S.A.
Access Restriction One Nation One Subscription (ONOS)
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword Sparse matrices Frequency Moment methods Testing Canning Surface impedance Matrix decomposition Central Processing Unit Shape Diffraction
Content Type Text
Resource Type Article
Subject Condensed Matter Physics Electrical and Electronic Engineering
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